Effect of Thickness Variation on the Measured Seebeck Coefficient and Power Factor in ITO-NiCr Thin‐Film Thermocouples
Jiang, Felix; Xie, Guangzhen; Heiß, Jochen; Zhang, Zhongkai; Ingebrandt, Sven; Vu, Xuan Thang (Corresponding author)
Weinheim : Wiley-VCH (2023)
Journal Article
In: Physica status solidi / A
Institutions
- Chair of Micro- and Nanosystems and Institute of Materials in Electrical Engineering [612510]
Identifier
- DOI: 10.1002/pssa.202300063
- DOI: 10.18154/RWTH-2023-06596
- RWTH PUBLICATIONS: RWTH-2023-06596