A Temperature Independent Readout Circuit for ISFET-Based Sensor Applications

Moussavi, Elmira; Sisejkovic, Dominik; Singh, Animesh; Kizatov, Daniyar; Leupers, Rainer; Ingebrandt, Sven; Pachauri, Vivek; Merchant, Farhad

Piscataway, NJ] : IEEE (2022)
Contribution to a book, Contribution to a conference proceedings

In: 23rd IEEE Latin-American Test Symposium : Montevideo, Uruguay, 5th-8th September 2022 / LATS 2022 ; technical sponsors: the Institute of Electrical and Electronics Engineering Inc, Test Technology Technical Council

Institutions

• Chair of Materials in Electrical Engineering I and Institute of Materials in Electrical Engineering [611510]
• Chair of Software for Systems on Silicon [611910]
• Chair of Micro- and Nanosystems and Institute of Materials in Electrical Engineering [612510]