An ultra-thin bendable Si-monolithic imaging test sensor

Dogiamis, Georgios (Corresponding author); Häfner, Joachim; Mokwa, Wilfried; Hosticka, Bedrich J.; Grabmaier, Anton

Piscataway, NJ : IEEE (2013)
Contribution to a book, Contribution to a conference proceedings

In: 2013 Transducers & Eurosensors XXVII : the 17th International Conference on Solid-State Sensors, Actuators and Microsystems ; Barcelona, Spain, 16 - 20 June 2013 / [IEEE Electron Devices Society]
Page(s)/Article-Nr.: 964-967


  • Chair of Materials in Electrical Engineering I and Institute of Materials in Electrical Engineering [611510]