Material characterisation of electroplated nickel structures for microsystem technology

Fritz, Thomas Michael; Mokwa, Wilfried; Schnakenberg, Uwe

New York, NY [u.a.] : Elsevier (2001)
Journal Article

In: Electrochimica acta
Volume: 47
Issue: 1/2
Page(s)/Article-Nr.: 55-60

Institutions

• Chair of Materials in Electrical Engineering I and Institute of Materials in Electrical Engineering [611510]