Determination of angular dependence of the critical field of barium ferrite from remanence and microwave measurements (abstract)

Schumacher, F.; Hempel, K. A.; von Staa, Frank

Melville, NY : IOP Publ. (1988)
Abstract, Journal Article

In: Journal of applied physics
Volume: 64
Issue: 10
Page(s)/Article-Nr.: 6000

Institutions

• Chair of Materials in Electrical Engineering I and Institute of Materials in Electrical Engineering [611510]