CMOS Transistors under Uniaxial Stress on Ultra-Thin Chips for Applications in Bendable Image Sensors

Häfner, Joachim; Dogiamis, Georgios; Mokwa, Wilfried; Hosticka, Bedrich J.; Grabmaier, Anton

Berlin [u.a.] : VDE-Verl. (2012)
Contribution to a book, Contribution to a conference proceedings

In: PRIME 2012 : 8th Conference on Ph.D. Research in Microelectronics & Electronics, 12 - 15 Juni 2012, Aachen, Germany / [General Chairs: Stefan Heinen ...]
Page(s)/Article-Nr.: 271-274

Institutions

  • Chair of Materials in Electrical Engineering I and Institute of Materials in Electrical Engineering [611510]

Identifier

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