Note: Characterization of electrode materials for dielectric spectroscopy

Malleo, Daniele; Nevill, J. Tanner; van Ooyen, André; Schnakenberg, Uwe; Lee, Luke P.; Morgan, Hywel

Melville, NY : AIP (2010)
Journal Article

In: Review of scientific instruments : RSI
Volume: 81
Issue: 1
Page(s)/Article-Nr.: 016104

Institutions

• Chair of Materials in Electrical Engineering I and Institute of Materials in Electrical Engineering [611510]