Characterization of electroplated nickel

Fritz, Thomas Michael (Corresponding author); Cho, H. S.; Hemker, K. J.; Mokwa, Wilfried; Schnakenberg, Uwe

Berlin [u.a.] : Springer (2002)
Journal Article

In: Microsystem technologies
Volume: 9
Issue: 1/2
Page(s)/Article-Nr.: 87-91

Institutions

• Chair of Materials in Electrical Engineering I and Institute of Materials in Electrical Engineering [611510]